DFT: Design For Testability
Design for testability is a concept from the
microelectronics industry. The DFT principle states that an
IC designer should consider
testability when designing their
circuit, in addition to the 'normal' considerations of
circuit function, size and
speed. Building in DFT features at the
circuit design stage increases the chance that
manufacturing defects within the
IC can be detected during the
test stage.
Improved testability leads to improved quality.