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Abbreviation for Discrete Fourier Transform, the lengthier method of space to frequency transformation which seems to be altogether replaced by the Fast Fourier Transform (FFT).

DFT: Design For Testability
Design for testability is a concept from the microelectronics industry. The DFT principle states that an IC designer should consider testability when designing their circuit, in addition to the 'normal' considerations of circuit function, size and speed. Building in DFT features at the circuit design stage increases the chance that manufacturing defects within the IC can be detected during the test stage.

Improved testability leads to improved quality.

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