display | more...
A method for analysing the surface composition of solids by mapping the distribution of elements and their concentrations.

A beam of ions bombard a polished section of the sample. The ejected ions are then identified by a mass spectrometer. The advantage to this method is that it isotopes, trace elements and light elements can be determined from low concentrations with a high degree of accuracy.

Log in or register to write something here or to contact authors.